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Defect count prediction via metric-based convolutional neural network

Meetesh Nevendra, Pradeep Singh

2021Neural Computing and Applications17 citationsDOI

Topics & Concepts

Computer scienceConvolutional neural networkBenchmark (surveying)Artificial intelligenceSoftwareDropout (neural networks)Deep learningMetric (unit)Machine learningArtificial neural networkWilcoxon signed-rank testSoftware qualityNetwork architectureSoftware metricData miningSoftware developmentStatisticsMathematicsGeographyOperations managementProgramming languageMann–Whitney U testComputer securityEconomicsGeodesySoftware Engineering ResearchSoftware Reliability and Analysis ResearchSoftware System Performance and Reliability
Defect count prediction via metric-based convolutional neural network | Litcius