Investigation of the recovery behavior of irradiation defects induced by a neutron in 4H-SiC combining Raman scattering and lattice parameters
Shouchao Zhang, Yang Yu, Hongfei Liu, Hongyu Chen, Xin Li, Defeng Liu, Fei Zhu, Zhipeng Liu, Yifei Cheng
Topics & Concepts
Raman spectroscopyMaterials scienceIrradiationAnnealing (glass)Raman scatteringLattice constantAnalytical Chemistry (journal)Neutron diffractionCrystallographyCrystal structureMolecular physicsDiffractionOpticsChemistryNuclear physicsComposite materialChromatographyPhysicsSilicon Carbide Semiconductor TechnologiesAdvanced ceramic materials synthesisSemiconductor materials and devices