Litcius/Paper detail

An integrated multiresolution framework for quality prediction and process monitoring in batch processes

Tiago J. Rato, Marco S. Reis

2020Journal of Manufacturing Systems26 citationsDOI

Topics & Concepts

Benchmark (surveying)Fault detection and isolationProcess (computing)Soft sensorFault (geology)CTQ treeSet (abstract data type)Quality (philosophy)Computer scienceAdaptabilityData miningEngineeringReliability engineeringArtificial intelligenceGeologyBiologyInjury preventionActuatorEnvironmental healthOperating systemEpistemologyGeographyDomestic violenceGeodesyEcologyPhilosophyMedicinePoison controlSeismologyProgramming languageFault Detection and Control SystemsMineral Processing and GrindingAdvanced Control Systems Optimization
An integrated multiresolution framework for quality prediction and process monitoring in batch processes | Litcius