Accelerated degradation testing for lifetime analysis considering random effects and the influence of stress and measurement errors
Yang Li, Haifeng Gao, Hongtian Chen, Chun Liu, Zhe Yang, Enrico Zio
Topics & Concepts
Stress (linguistics)Degradation (telecommunications)Random errorWiener processExpression (computer science)Computer scienceProcess (computing)Random effects modelReliability engineeringStatisticsAlgorithmMathematicsEngineeringTelecommunicationsMeta-analysisLinguisticsProgramming languageMedicineInternal medicinePhilosophyOperating systemReliability and Maintenance OptimizationPower System Reliability and MaintenanceMachine Fault Diagnosis Techniques