Laser ablation sample preparation for atom probe tomography and transmission electron microscopy
Neville H. White, Katja Eder, J. Byrnes, Julie M. Cairney, Ingrid McCarroll
Topics & Concepts
Atom probeMaterials scienceTransmission electron microscopySiliconWaferLaser ablationMicrostructureSample preparationLaserMicroscopyAblationAluminiumElectron microscopeCharacterization (materials science)Analytical Chemistry (journal)OpticsComposite materialNanotechnologyOptoelectronicsChemistryAerospace engineeringPhysicsEngineeringChromatographyAdvanced Materials Characterization TechniquesDiamond and Carbon-based Materials ResearchIon-surface interactions and analysis