Location and timestamp-based chip contour detection using LWMG-YOLOv5
Bao Rong Chang, Hsiu-Fen Tsai, Chia‐Wei Hsieh
Topics & Concepts
ChipTimestampComputer scienceSemiconductor device fabricationContour lineConvolution (computer science)Power consumptionReal-time computingArtificial intelligencePower (physics)EngineeringTelecommunicationsArtificial neural networkElectrical engineeringPhysicsQuantum mechanicsWaferMeteorologyIndustrial Vision Systems and Defect DetectionAdvanced Neural Network ApplicationsVehicle License Plate Recognition