Spectroscopic analysis and thermoelectric properties of ITO/Cu/Ni/ITO multilayer by RF sputtering
Abdelaziz Tchenka, Abdelali Agdad, L. Amiri, Mohammed Bousseta, Abdelkarim El Mouncharih, S. Elmassi, L. Nkhaili, E. Ech‐chamikh
Topics & Concepts
Materials scienceTransmittanceFigure of meritSeebeck coefficientAnnealing (glass)Thermoelectric effectSputteringElectrical resistivity and conductivityBand gapAnalytical Chemistry (journal)DiffractionSputter depositionOptoelectronicsThin filmOpticsMetallurgyChemistryComposite materialNanotechnologyThermal conductivityElectrical engineeringChromatographyEngineeringPhysicsThermodynamicsAdvanced Thermoelectric Materials and DevicesAdvanced Sensor Technologies ResearchChalcogenide Semiconductor Thin Films