An 8-Bit 800 MS/s Loop-Unrolled SAR ADC With Common-Mode Adaptive Background Offset Calibration in 28 nm FDSOI
Ayça Akkaya, Firat Çelik, Yusuf Leblebici
Abstract
This paper presents a low-power single-channel 8-bit loop-unrolled (LU) successive approximation register (SAR) analog-to-digital-converter (ADC) with a novel common-mode adaptive background comparator offset calibration scheme. LU-SAR ADCs use multiple comparators to reduce the SAR loop delay. Offset mismatch between the comparators severely degrades the effective resolution. This paper addresses the common-mode voltage variation in the LU-SAR architecture due to comparator kickback and the problems related to the common-mode dependency of the comparator offset. The proposed offset calibration scheme ensures that the comparators are calibrated at the same input common-mode voltage at which they each operate during the SAR conversion to prevent the common-mode dependent offset mismatch between them. Moreover, the proposed ADC design exploits the common-mode variation immunity of the proposed calibration scheme to optimize the figure-of-merit (FoM). The prototype ADC manufactured in 28nm FDSOI CMOS achieves 42.57dB signal-to-noise-and-distortion ratio and 22.8fJ/conv.-step FoM at 800MS/s with near Nyquist frequency input, and occupies an area of 0.0037mm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> .