An improved lifetime prediction method for metallized film capacitor considering harmonics and degradation process
Chunlin Lv, Jinjun Liu, Yan Zhang, Wanjun Lei, Rui Cao
Topics & Concepts
HarmonicsDegradation (telecommunications)CapacitorCapacitanceMaterials scienceConvertersPower (physics)ResistorElectronic engineeringCoupling (piping)Series (stratigraphy)Process (computing)Electrical engineeringEngineeringComputer scienceComposite materialVoltageElectrodeThermodynamicsChemistryPhysicsBiologyOperating systemPaleontologyPhysical chemistrySilicon Carbide Semiconductor TechnologiesSemiconductor materials and devicesElectromagnetic Compatibility and Noise Suppression