Litcius/Paper detail

A review of the electric measurements and their failure criteria for solder joint degradation

Dorottya Varga, Péter Jánoš Szabó, Attila Szlancsik

2024Materials Science in Semiconductor Processing11 citationsDOIOpen Access PDF

Abstract

The assessment of solder joint quality and reliability in electronic devices has an important role in many industries and guarantees challenges for reliability engineers. This article explores various methods for the electrical measurement of solder joints, focusing on resistance measurement, impedance measurement, and thermal resistance measurement. Based on the presented articles, impedance measurement emerges as the most effective method, although its complexity can limit its profitability. Resistance measurement, while approaching the accuracy of impedance measurement, is more widely used due to its simplicity. Thermal resistance measurement, although complicated, provides less precise results compared to the other methods. Various standards define failure based on similar criteria, with IPC-9701B offering the latest and best-defined criteria for data logger measurements. It is suggested that future literature adopt this evaluation method to enhance the comparability of different measurement results for solder joint failure. The relationship between crack length and electrical properties is crucial for detecting and predicting potential failures in solder joints. Establishing a clear connection between crack length and electrical properties can lead to more rational failure criteria, reducing the likelihood of overdesigning solder joints.

Topics & Concepts

SolderingReliability (semiconductor)Reliability engineeringMaterials scienceJoint (building)Electrical impedanceTemperature cyclingComputer scienceMechanical engineeringThermalElectrical engineeringStructural engineeringComposite materialEngineeringPhysicsMeteorologyQuantum mechanicsPower (physics)Electronic Packaging and Soldering TechnologiesIntegrated Circuits and Semiconductor Failure Analysis3D IC and TSV technologies