On line detection of defective apples using computer vision system combined with deep learning methods
Shuxiang Fan, Jiangbo Li, Yunhe Zhang, Xi Tian, Qingyan Wang, Xin He, Chi Zhang, Wenqian Huang
Topics & Concepts
Artificial intelligenceSupport vector machineConvolutional neural networkComputer sciencePattern recognition (psychology)Classifier (UML)Deep learningMachine visionImage processingSortingRecallComputer visionImage (mathematics)AlgorithmPhilosophyLinguisticsSmart Agriculture and AISpectroscopy and Chemometric AnalysesDate Palm Research Studies