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Low Loss and Low EMI Noise CSTBT With Split Gate and Recessed Emitter Trench

Jinping Zhang, Xiang Xiao, Rong-Rong Zhu, Qian Zhao, Bo Zhang

2021IEEE Journal of the Electron Devices Society14 citationsDOIOpen Access PDF

Abstract

A novel carrier stored trench bipolar transistor (CSTBT) with split gate (SG) and recessed emitter trench (SGRET CSTBT) is proposed. The proposed device features a SG structure with thicker oxide layer under the trench gate and recessed trench emitter, respectively. Compared with the conventional CSTBT with recessed emitter trench (RET CSTBT), the proposed device not only significantly reduces the gate-collector capacitance ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${C} _{\mathrm{ GC}}$ </tex-math></inline-formula> ) but also alleviates the negative impact of the heavily doped n-type carrier stored layer on the breakdown voltage ( <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">BV</i> ). Simulation results show that with the similar <italic xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">BV</i> of about 650V, the on-state voltage drop ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V} _{\mathrm{ ceon}}$ </tex-math></inline-formula> ) at <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${J} _{\mathrm{ ce}}$ </tex-math></inline-formula> =200A/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> for the proposed SGRET CSTBT is only 1.11V, which is 0.19V lower than that of the conventional RET CSTBT. Moreover, compared with the conventional RET CSTBT, the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${C} _{\mathrm{ GC}}$ </tex-math></inline-formula> at the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V} _{\mathrm{ ce}}$ </tex-math></inline-formula> of 25V, total gate charge ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${Q} _{\mathrm{ G}}$ </tex-math></inline-formula> ) and miller plateau charge ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${Q} _{\mathrm{ GC}}$ </tex-math></inline-formula> ) for the proposed device are reduced by 84.3%, 38.6% and 51.6%, respectively. As a result, the trade-off relationship between the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V} _{\mathrm{ ceon}}$ </tex-math></inline-formula> and turn-off loss ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${E} _{\mathrm{ off}}$ </tex-math></inline-formula> ) as well as trade-off relationship between the turn-on loss ( <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${E} _{\mathrm{ on}}$ </tex-math></inline-formula> ) and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{d}{V} _{\mathrm{ ak}} / \text{d}{t}$ </tex-math></inline-formula> of the free-wheeling diode (FWD) are significantly improved for the proposed device. At the same <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${V} _{\mathrm{ ceon}}$ </tex-math></inline-formula> of 1.16V, the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${E} _{\mathrm{ off}}$ </tex-math></inline-formula> is reduced from 9.2mJ/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> of the conventional one to 3.3mJ/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> of the proposed device. At the same <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${E} _{\mathrm{ on}}$ </tex-math></inline-formula> of 8.3mJ/cm <sup xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sup> , the <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\text{d}{V} _{\mathrm{ ak}} / \text{d}{t}$ </tex-math></inline-formula> of FWD for the proposed device is reduced by 24.5% compared with that of the conventional RET CSTBT, which significantly suppresses the EMI noise.

Topics & Concepts

Common emitterPhysicsMaterials scienceAlgorithmOptoelectronicsAnalytical Chemistry (journal)Topology (electrical circuits)Electrical engineeringMathematicsCombinatoricsChemistryEngineeringChromatographySemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignSilicon Carbide Semiconductor Technologies