A lightweight and efficient model for surface tiny defect detection
Zhilong Yu, Yuxiang Wu, Binqian Wei, Zikang Ding, Fei Luo
Topics & Concepts
Computer sciencePyramid (geometry)Artificial intelligenceAlgorithmPhysicsOpticsIndustrial Vision Systems and Defect DetectionAdvanced Neural Network ApplicationsSurface Roughness and Optical Measurements