Removal and Reoccurrence of LLZTO Surface Contaminants under Glovebox Conditions
Marco Siniscalchi, Joshua S. Gibson, James Tufnail, Jack E. N. Swallow, Jarrod Lewis, Guillaume Matthews, Burcu Karagoz, M. A. Van Spronsen, Georg Held, Robert S. Weatherup, C.R.M. Grovenor, Susannah Speller
Abstract
High Resolution Image Download MS PowerPoint Slide The reactivity of Li 6.4 La 3 Zr 1.4 Ta 0.6 O 12 (LLZTO) solid electrolytes to form lithio-phobic species such as Li 2 CO 3 on their surface when exposed to trace amounts of H 2 O and CO 2 limits the progress of LLZTO-based solid-state batteries. Various treatments, such as annealing LLZTO within a glovebox or acid etching, aim at removing the surface contaminants, but a comprehensive understanding of the evolving LLZTO surface chemistry during and after these treatments is lacking. Here, glovebox-like H 2 O and CO 2 conditions were recreated in a near ambient pressure X-ray photoelectron spectroscopy chamber to analyze the LLZTO surface under realistic conditions. We find that annealing LLZTO at 600 °C in this atmosphere effectively removes the surface contaminants, but a significant level of contamination reappears upon cooling down. In contrast, HCl (aq) acid etching demonstrates superior Li 2 CO 3 removal and stable surface chemistry post treatment. To avoid air exposure during the acid treatment, an anhydrous HCl solution in diethyl ether was used directly within the glovebox. This novel acid etching strategy delivers the lowest lithium/LLZTO interfacial resistance and the highest critical current density.