Data-driven models in reliability analysis for tunnel structure: A systematic review
Wenbo Qin, Elton J. Chen, Fan Wang, Wenli Liu, Cheng Zhou
Topics & Concepts
Reliability (semiconductor)EngineeringMathematicsReliability engineeringComputer sciencePhysicsThermodynamicsPower (physics)Geotechnical Engineering and AnalysisConcrete Corrosion and DurabilityProbabilistic and Robust Engineering Design