Stereometric analysis of TiO2 thin films deposited by electron beam ion assisted
Reza Shakoury, Ali Arman, Ştefan Ţălu, Davoud Dastan, Carlos Luna, Sahar Rezaee
Topics & Concepts
Materials scienceThin filmIon beamBand gapTransmittanceSurface roughnessAnalytical Chemistry (journal)OpticsDeposition (geology)Surface finishOptoelectronicsBeam (structure)NanotechnologyComposite materialChemistrySedimentPaleontologyBiologyPhysicsChromatographySurface Roughness and Optical MeasurementsLaser-induced spectroscopy and plasmaElectron and X-Ray Spectroscopy Techniques