Semi-supervised learning with GAN for automatic defect detection from images
Gaowei Zhang, Yue Pan, Limao Zhang
Topics & Concepts
Artificial intelligenceComputer scienceSegmentationPattern recognition (psychology)Cross entropyConvolutional neural networkDiscriminatorLeverage (statistics)PixelFeature learningLabeled dataImage segmentationDetectorTelecommunicationsIndustrial Vision Systems and Defect DetectionIntegrated Circuits and Semiconductor Failure AnalysisNon-Destructive Testing Techniques