Enhancing reliability in oxide-based memristors using two-dimensional transition metal dichalcogenides
Donghyeon Lee, Seung Mo Kim, Jun-Cheol Park, Yoonsung Jung, Soyeon Lee, Soyeon Lee, Byoung Hun Lee, Sanghan Lee, Sanghan Lee
Topics & Concepts
MemristorReliability (semiconductor)Transition metalOxideMaterials scienceMetalNanotechnologyReliability engineeringMetallurgyChemistryElectronic engineeringThermodynamicsEngineeringPhysicsPower (physics)BiochemistryCatalysisAdvanced Memory and Neural ComputingPhotoreceptor and optogenetics researchNeuroscience and Neural Engineering