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Effect of voids on thermomechanical cracking in lead-free Sn3Ag0.5Cu interconnections of power modules

J. Hagberg, Olli Nousiainen, Jussi Putaala, Olli Salmela, Juha Raumanni, Matti Rahko, T. Kangasvieri, Jussi Jääskeläinen, Timo Galkin, Heli Jantunen

2020Microelectronics Reliability12 citationsDOIOpen Access PDF

Topics & Concepts

Materials scienceSolderingVoid (composites)CrackingComposite materialCreepIntergranular corrosionInterconnectionViscoplasticityRecrystallization (geology)Structural engineeringFinite element methodMicrostructureConstitutive equationPaleontologyBiologyComputer scienceComputer networkEngineeringElectronic Packaging and Soldering TechnologiesAdvanced Welding Techniques AnalysisAluminum Alloy Microstructure Properties
Effect of voids on thermomechanical cracking in lead-free Sn3Ag0.5Cu interconnections of power modules | Litcius