A deep learning based automatic defect analysis framework for In-situ TEM ion irradiations
Mingren Shen, Guanzhao Li, Dongxia Wu, Yudai Yaguchi, Jack Haley, Kevin G. Field, Dane Morgan
Topics & Concepts
Computer scienceHigh fidelityTracking (education)Materials scienceTransmission electron microscopyArtificial intelligenceNanotechnologyPhysicsAcousticsPsychologyPedagogyDomain Adaptation and Few-Shot LearningAdvanced Neural Network ApplicationsIndustrial Vision Systems and Defect Detection