Litcius/Paper detail

Usefulness of techniques to measure and model crop growth and yield at different spatial scales

Di He, Enli Wang, John A. Kirkegaard, Eusun Han, Brendan Malone, Tony Swan, Stuart D. Brown, Mark Glover, Roger Lawes, Julianne M. Lilley

2024Field Crops Research9 citationsDOI

Topics & Concepts

Measure (data warehouse)Yield (engineering)CropAgronomyMathematicsEnvironmental scienceBiologyComputer sciencePhysicsData miningThermodynamicsRemote Sensing in AgricultureClimate change impacts on agricultureCrop Yield and Soil Fertility