Understanding the Electron Beam Resilience of Two-Dimensional Conjugated Metal–Organic Frameworks
David Mücke, Isabel Cooley, Baokun Liang, Zhiyong Wang, Sang-Wook Park, Renhao Dong⧫, Xinliang Feng, Haoyuan Qi, Elena Besley, Ute Kaiser
Abstract
High Resolution Image Download MS PowerPoint Slide Knowledge of the atomic structure of layer-stacked two-dimensional conjugated metal–organic frameworks (2D c-MOFs) is an essential prerequisite for establishing their structure–property correlation. For this, atomic resolution imaging is often the method of choice. In this paper, we gain a better understanding of the main properties contributing to the electron beam resilience and the achievable resolution in the high-resolution TEM images of 2D c-MOFs, which include chemical composition, density, and conductivity of the c-MOF structures. As a result, sub-angstrom resolution of 0.95 Å has been achieved for the most stable 2D c-MOF of the considered structures, Cu 3 (BHT) (BHT = benzenehexathiol), at an accelerating voltage of 80 kV in a spherical and chromatic aberration-corrected TEM. Complex damage mechanisms induced in Cu 3 (BHT) by the elastic interactions with the e-beam have been explained using detailed ab initio molecular dynamics calculations. Experimental and calculated knock-on damage thresholds are in good agreement.