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Frequency and voltage-dependent electrical parameters, interface traps, and series resistance profile of Au/(NiS:PVP)/n-Si structures

Murat Ulusoy, Ş. Altındal, Perihan Durmuş, Süleyman Özçelik, Yashar Azizian‐Kalandaragh

2021Journal of Materials Science Materials in Electronics24 citationsDOI

Topics & Concepts

Equivalent series resistanceDopingDepletion regionMaterials scienceAnalytical Chemistry (journal)DipoleVoltagePolarization (electrochemistry)Condensed matter physicsOptoelectronicsChemistrySemiconductorElectrical engineeringEngineeringOrganic chemistryChromatographyPhysical chemistryPhysicsSemiconductor materials and interfacesSemiconductor materials and devicesSilicon and Solar Cell Technologies
Frequency and voltage-dependent electrical parameters, interface traps, and series resistance profile of Au/(NiS:PVP)/n-Si structures | Litcius