Absolute phase retrieval of shiny objects using fringe projection and deep learning with computer-graphics-based images
Kazumasa Ueda, Kanami Ikeda, Osanori Koyama, Makoto Yamada
Abstract
Fringe projection profilometry is a high-precision method used to measure the 3D shape of an object by projecting sinusoidal fringes onto an object. However, fringes projected onto a metallic or shiny object are distorted nonlinearly, which causes significant measurement errors. A high-precision measurement method for shiny objects that employs computer graphics (CG) and deep learning is proposed. We trained a deep neural network by projecting fringes on a shiny object in CG space. Our results show that the method can reduce the nonlinear fringe distortion caused by gloss in real space.
Topics & Concepts
Artificial intelligenceStructured-light 3D scannerOpticsComputer scienceComputer visionGloss (optics)Deep learningArtificial neural networkProjection (relational algebra)Absolute phaseProfilometerDistortion (music)Phase retrievalSpatial frequencyMetrologyInterferometryFourier transformImage processingMeasure (data warehouse)Object (grammar)Computer graphicsVisualizationComputer graphics (images)Speckle patternGraphicsIterative reconstructionRobustness (evolution)Fresnel diffractionCognitive neuroscience of visual object recognitionPhase unwrappingAdvanced X-ray Imaging TechniquesOptical measurement and interference techniquesDigital Holography and Microscopy