Litcius/Paper detail

Upgrade of the small-angle neutron scattering diffractometer SANS-J at JRR-3

Takayuki Kumada, Ryuhei Motokawa, Yojiro Oba, Hiroshi Nakagawa, Yurina Sekine, Cyril Micheau, Yuki Ueda, Tsuyoshi Sugita, A. Birumachi, Miki Sasaki, Kosuke Hiroi, Hiroki Iwase

2023Journal of Applied Crystallography34 citationsDOI

Abstract

The small-angle neutron scattering diffractometer SANS-J at the research reactor JRR-3, Tokai, Japan has been upgraded. A 3 He front detector was installed adjacent to the direct beam just behind the sample position to cover scattering in the range 1.3–6 nm −1 for the magnitude of the scattering vector Q . Additionally, the maximum Q covered by the existing main 3 He detector was extended to 1.8 nm −1 by decreasing the minimum sample-to-detector distance. These modifications enabled gapless measurements of the scattering curve in the Q range 0.002–6 nm −1 with three standard device layouts that can be changed within 10 min. A new graphical user interface simplifies the operation of the device layouts and data acquisition.

Topics & Concepts

ScatteringSmall-angle scatteringNeutron scatteringSmall-angle neutron scatteringDiffractometerDetectorPowder DiffractometerOpticsPhysicsNeutronNeutron time-of-flight scatteringMaterials scienceNuclear physicsBeam (structure)Range (aeronautics)DiffractionScanning electron microscopeComposite materialNuclear Physics and ApplicationsAtomic and Subatomic Physics ResearchRadiation Detection and Scintillator Technologies