Single-hemisphere photoelectron momentum microscope with time-of-flight recording
G. Schönhense, S. Babenkov, D. Vasilyev, H.-J. Elmers, K. Medjanik
Abstract
Photoelectron momentum microscopy is an emerging powerful method for angle-resolved photoelectron spectroscopy (ARPES), especially in combination with imaging spin filters. These instruments record kx–ky images, typically exceeding a full Brillouin zone. As energy filters, double-hemispherical or time-of-flight (ToF) devices are in use. Here, we present a new approach for momentum mapping of the full half-space, based on a large single hemispherical analyzer (path radius of 225 mm). Excitation by an unfocused He lamp yielded an energy resolution of 7.7 meV. The performance is demonstrated by k-imaging of quantum-well states in Au and Xe multilayers. The α2-aberration term (α, entrance angle in the dispersive plane) and the transit-time spread of the electrons in the spherical field are studied in a large pass-energy (6 eV–660 eV) and angular range (α up to ±7°). It is discussed how the method circumvents the preconditions of previous theoretical work on the resolution limitation due to the α2-term and the transit-time spread, being detrimental for time-resolved experiments. Thanks to k-resolved detection, both effects can be corrected numerically. We introduce a dispersive-plus-ToF hybrid mode of operation, with an imaging ToF analyzer behind the exit slit of the hemisphere. This instrument captures 3D data arrays I (EB, kx, ky), yielding a gain up to N2 in recording efficiency (N being the number of resolved time slices). A key application will be ARPES at sources with high pulse rates such as synchrotrons with 500 MHz time structure.