Topological analysis of X-ray CT data for the recognition and trending of subtle changes in microstructure under material aging
Amitesh Maiti, Aniketh Venkat, Graham Kosiba, William L. Shaw, John D. Sain, Rebecca Lindsey, Christian D. Grant, Peer‐Timo Bremer, Attila Gyulassy, Valerio Pascucci, Richard H. Gee
Topics & Concepts
Automatic summarizationCharacterization (materials science)Computer scienceConvolutional neural networkArtificial intelligenceTomographyTopology (electrical circuits)Field (mathematics)Pattern recognition (psychology)Process (computing)Image processingImage (mathematics)AlgorithmMaterials sciencePhysicsMathematicsOpticsNanotechnologyPure mathematicsOperating systemCombinatoricsTopological and Geometric Data AnalysisMedical Imaging Techniques and ApplicationsCell Image Analysis Techniques