Exploring photogenerated charge carrier transfer in semiconductor/metal junctions using Kelvin probe force microscopy
Chuanbiao Bie, Zheng Meng, Bowen He, Bei Cheng, Gang Liu, Bicheng Zhu
Topics & Concepts
Kelvin probe force microscopeSemiconductorMaterials scienceOhmic contactSchottky barrierCharge carrierOptoelectronicsElectron transferSchottky diodeNanotechnologyChemical physicsChemistryDiodePhotochemistryAtomic force microscopyLayer (electronics)Nanowire Synthesis and ApplicationsForce Microscopy Techniques and ApplicationsMolecular Junctions and Nanostructures