A Comprehensive Analysis of Different SRAM Cell Topologies in 7-nm FinFET Technology
Erfan Abbasian, Shilpi Birla, Morteza Gholipour
Topics & Concepts
Static random-access memoryTransistorSubthreshold conductionCMOSDecoupling (probability)Materials scienceElectrical engineeringLeakage (economics)Electronic engineeringVoltageComputer scienceOptoelectronicsEngineeringMacroeconomicsEconomicsControl engineeringSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignLow-power high-performance VLSI design