Assessment of Trap Charges for Analog/RF FOMs and Linearity Behaviour on InAs Based Dual Metal Hetero Gate Oxide TFET for Enhanced Reliability
Vedvrat
Topics & Concepts
Materials scienceTrap (plumbing)Reliability (semiconductor)OxideOptoelectronicsMetalLinearityDual (grammatical number)Electronic engineeringMetallurgyThermodynamicsEnvironmental engineeringEngineeringArtLiteraturePower (physics)PhysicsSemiconductor materials and devicesAdvancements in Semiconductor Devices and Circuit DesignIntegrated Circuits and Semiconductor Failure Analysis