Characterization of zirconium oxides part II: New insights on the growth of zirconia revealed through complementary high-resolution mapping techniques
Corey M. Efaw, Jordan Vandegrift, Michael Reynolds, Brian J. Jaques, Hongqiang Hu, Hui Xiong, Michael F. Hurley
Topics & Concepts
Kelvin probe force microscopeZirconiumTetragonal crystal systemRaman spectroscopyScanning electron microscopeCubic zirconiaMaterials sciencePhase (matter)MetalMicroscopyAnalytical Chemistry (journal)ChemistryMetallurgyNanotechnologyOpticsAtomic force microscopyComposite materialPhysicsOrganic chemistryChromatographyCeramicNuclear Materials and PropertiesRadioactive element chemistry and processingHydrogen embrittlement and corrosion behaviors in metals