Fracture surface analysis and quantitative characterization of gallium arsenide III-V semiconductors using fractography
Anthony Moulins, Roberto Dugnani, Ricardo J. Zednik
Topics & Concepts
FractographyGallium arsenideCharacterization (materials science)Materials scienceFracture (geology)SemiconductorOptoelectronicsComposite materialForensic engineeringNanotechnologyEngineeringIntegrated Circuits and Semiconductor Failure AnalysisIon-surface interactions and analysisNanowire Synthesis and Applications