Energy-efficient radiation hardened SRAM cell for low voltage terrestrial applications
Govind Prasad, Bipin Chandra Mandi, Maifuz Ali
Topics & Concepts
Static random-access memoryDiceVoltageMonte Carlo methodSingle event upsetLow voltageSoft errorElectronic engineeringComputer scienceEngineeringElectrical engineeringMathematicsGeometryStatisticsRadiation Effects in ElectronicsLow-power high-performance VLSI designAdvancements in Battery Materials