AR-XRF measurements and data treatment for the evaluation of gilding samples of cultural heritage
Jacopo Orsilli, Alessandro Migliori, Roman Padilla-Alvarez, M. Martini, Anna Gallì
Abstract
AR-XRF has been employed to measure the thickness of gildings in laboratory samples, proving its advantages for the analysis of cultural heritage samples.
Topics & Concepts
Cultural heritageMeasure (data warehouse)Analytical Chemistry (journal)ArchaeologyMineralogyEnvironmental chemistryChemistryGeographyComputer scienceData miningX-ray Spectroscopy and Fluorescence AnalysisCultural Heritage Materials AnalysisIon-surface interactions and analysis