Anisotropic Fracture of Two-Dimensional Ta<sub>2</sub>NiSe<sub>5</sub>
Binzhao Li, Jiahao Li, Wei Jiang, Yafei Wang, Dong Wang, Li Song, YinBo Zhu, HengAn Wu, Guorui Wang, Zhong Zhang
Abstract
Anisotropic two-dimensional materials present a diverse range of physical characteristics, making them well-suited for applications in photonics and optoelectronics. While mechanical properties play a crucial role in determining the reliability and efficacy of 2D material-based devices, the fracture behavior of anisotropic 2D crystals remains relatively unexplored. Toward this end, we herein present the first measurement of the anisotropic fracture toughness of 2D Ta 2 NiSe 5 by microelectromechanical system-based tensile tests. Our findings reveal a significant in-plane anisotropic ratio (∼3.0), accounting for crystal orientation-dependent crack paths. As the thickness increases, we observe an intriguing intraplanar-to-interplanar transition of fracture along the a -axis, manifesting as stepwise crack features attributed to interlayer slippage. In contrast, ruptures along the c -axis surprisingly exhibit persistent straightness and smoothness regardless of thickness, owing to the robust interlayer shear resistance. Our work affords a promising avenue for the construction of future electronics based on nanoribbons with atomically sharp edges.