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Fault-Tolerant Deep Neural Networks for Processing-In-Memory based Autonomous Edge Systems

Siyue Wang, Geng Yuan, Xiaolong Ma, Yanyu Li, Xue Lin, Bhavya Kailkhura

20222022 Design, Automation & Test in Europe Conference & Exhibition (DATE)10 citationsDOI

Abstract

In-memory deep neural network (DNN) accelerators will be the key for energy-efficient autonomous edge systems. The resistive random access memory (ReRAM) is a potential solution for the non-CMOS-based in-memory computing platform for energy-efficient autonomous edge systems, thanks to its promising characteristics, such as near-zero leakage-power and non-volatility. However, due to the hardware instability of ReRAM, the weights of the DNN model may deviate from the originally trained weights, resulting in accuracy loss. To mitigate this undesirable accuracy loss, we propose two stochastic fault-tolerant training methods to generally improve the models' robustness without dealing with individual devices. Moreover, we propose Stability Score-a comprehensive metric that serves as an indicator to the instability problem. Extensive experiments demonstrate that the DNN models trained using our proposed stochastic fault-tolerant training method achieve superior performance, which provides better flexibility, scalability, and deployability of ReRAM on the autonomous edge systems.

Topics & Concepts

Computer scienceResistive random-access memoryScalabilityRobustness (evolution)Fault toleranceArtificial neural networkEdge deviceEdge computingEnhanced Data Rates for GSM EvolutionDistributed computingArtificial intelligenceEmbedded systemComputer engineeringEngineeringGeneElectrical engineeringChemistryBiochemistryVoltageCloud computingOperating systemDatabaseAdvanced Memory and Neural ComputingFerroelectric and Negative Capacitance DevicesAdvanced Neural Network Applications
Fault-Tolerant Deep Neural Networks for Processing-In-Memory based Autonomous Edge Systems | Litcius