Advanced scanning electron microscopy techniques for structural characterization of zeolites
Natsuko Asano, Shunsuke Asahina, Jinfeng Lü, Jiani Xu, Yanfeng Shen, Zhengxing Qin, Svetlana Mintova
Abstract
Chemical etching after Ar ion beam cross sectioning enables the formation of zeolite internal nano structures to be observed directly using a newly developed highly sensitive scanning electron microscope.
Topics & Concepts
Scanning electron microscopeCharacterization (materials science)Materials scienceFocused ion beamElectron microscopeZeoliteEtching (microfabrication)NanotechnologyChemical engineeringAnalytical Chemistry (journal)ChemistryIonOpticsComposite materialChromatographyOrganic chemistryCatalysisEngineeringLayer (electronics)PhysicsAdvanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesZeolite Catalysis and Synthesis