A 13-Bit ENOB Third-Order Noise-Shaping SAR ADC Employing Hybrid Error Control Structure and LMS-Based Foreground Digital Calibration
Qihui Zhang, Ning Ning, Zhong Zhang, Jing Li, Kejun Wu, Yong Chen, Qi Yu
Abstract
This article presents a third-order noise-shaping (NS) successive approximation register (SAR) analog-to-digital converter (ADC), which exploits a hybrid error control topology to increase the order of the noise-transfer function (NTF). This scheme is a hybrid of two NS stages, namely, a cascaded integrator feed-forward (CIFF) and an error feedback (EF). This EF-CIFF structure contributes a more effective NS capability and enhances the robustness of the high-order NTF. An improved dither-based digital calibration is developed to mitigate the harmonic distortion caused by the capacitor mismatch. Due to the usage of an averaging filter, this calibration greatly reduces the interference of quantization noise on mismatch extraction while only needing a minimum modification in a standard SAR Topology. Hence, our scheme is simple and inherently robust to the process, voltage, and temperature variation. Based on an 8-bit SAR, our prototype is fabricated in a 130-nm CMOS process. It consumes a 96- <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\mu \text{W}$ </tex-math></inline-formula> power when operating at a 2-MS/s sampling frequency with a 1.2-V supply. The proposed NS-SAR yields a peak Schreier figure of merit of 170.7 dB with a signal-to-noise-and-distortion ratio (SNDR) of 79.57 dB at an oversampling ratio of 8.