Integrated predictive maintenance approach for multistate manufacturing system considering geometric and non-geometric defects of products
Yao Li, Yihai He, Ruoyu Liao, Xin Zheng, Wei Dai
Topics & Concepts
Reliability (semiconductor)Reliability engineeringProduct (mathematics)Time horizonMinificationConnotationComputer scienceMathematical optimizationEngineeringMathematicsPhysicsGeometryLinguisticsQuantum mechanicsPower (physics)PhilosophyReliability and Maintenance OptimizationLife Cycle Costing AnalysisRisk and Safety Analysis