Testability and Dependability of AI Hardware: Survey, Trends, Challenges, and Perspectives
Fei Su, Chunsheng Liu, Haralampos‐G. Stratigopoulos
Abstract
Hardware realization of artificial intelligence (AI) requires new design styles and even underlying technologies than those used in traditional digital processors or logic circuits. Therefore, their dependability and testability requirements, challenges, and solutions are fundamentally different and unique. This survey article covers this very important topic and provides insight to such issues.—Mehdi Tahoori, Karlsruhe Institute of Technology
Topics & Concepts
TestabilityDependabilityRealization (probability)Computer scienceComputer architectureDesign for testingDigital electronicsSoftware engineeringEmbedded systemReliability engineeringEngineeringElectronic circuitElectrical engineeringStatisticsMathematicsRadiation Effects in ElectronicsVLSI and Analog Circuit TestingPhysical Unclonable Functions (PUFs) and Hardware Security