Reliable determination of SiO2 concentrations in sediments via sequential leaching and ICP-OES/MS analysis
Juan Xu, Yulong Guo, Shouye Yang, Simon V. Hohl, Wen Zhang
Topics & Concepts
Leaching (pedology)GeologyInductively coupled plasma atomic emission spectroscopyInductively coupled plasma mass spectrometryGeochemistryEnvironmental chemistryMineralogyInductively coupled plasmaChemistryMass spectrometrySoil scienceChromatographyPlasmaPhysicsQuantum mechanicsSoil waterGeochemistry and Geologic MappingGeochemistry and Elemental AnalysisGeological and Geochemical Analysis