Interplays between TM migration, cation mixing and oxygen defects and their impacts on degradation of layer-structured oxide cathode materials
Shuwei Li, Yixin Li, Zhenjie Zhang, Xi Shen, Hongxiang Ji, Zepeng Liu, Zilin Hu, Haibo Wang, Hao Yu, Zhiwei Hu, Shu‐Chih Haw, Chien‐Te Chen, Qingyu Kong, Yurui Gao, Xuefeng Wang, Richeng Yu, Zhaoxiang Wang, Liquan Chen, Zhaoxiang Wang, Liquan Chen
Topics & Concepts
Materials scienceDegradation (telecommunications)Mixing (physics)OxideCathodeLayer (electronics)OxygenChemical engineeringInorganic chemistryNanotechnologyMetallurgyPhysical chemistryElectronic engineeringOrganic chemistryChemistryQuantum mechanicsPhysicsEngineeringAdvancements in Battery MaterialsSemiconductor materials and devicesElectronic and Structural Properties of Oxides