Genotype by yield*trait (GYT) biplot analysis: a novel approach for evaluating advance lines of durum wheat
Muhammad Faheem, Saima Mir Arain, Mahboob Ali Sial, Khalil Ahmed Laghari, Abdul Qayyum
Topics & Concepts
BiplotTraitGenotypeYield (engineering)Grain yieldBiologyAgronomyVeterinary medicineGeneticsMedicineGeneComputer scienceMetallurgyMaterials scienceProgramming languageGenetics and Plant BreedingWheat and Barley Genetics and PathologyGenetic Mapping and Diversity in Plants and Animals