Wiring surface loss of a superconducting transmon qubit
Nikita S. Smirnov, Elizaveta A. Krivko, Anastasiya A. Solovyova, Аnton I. Ivanov, Ilya A. Rodionov
Abstract
Quantum processors using superconducting qubits suffer from dielectric loss leading to noise and dissipation. Qubits are usually designed as large capacitor pads connected to a non-linear Josephson junction (or SQUID) by a superconducting thin metal wiring. Here, we report on finite-element simulation and experimental results confirming that more than 50% of surface loss in transmon qubits can originate from Josephson junctions wiring and can limit qubit relaxation time. We experimentally extracted dielectric loss tangents of qubit elements and showed that dominant surface loss of wiring can occur for real qubits designs. Finally, we experimentally demonstrate up to 20% improvement in qubit quality factor by wiring design optimization.