Litcius/Paper detail

In-situ layer-wise certification for direct laser deposition processes based on thermal image series analysis

Mehrnaz Noroozi Esfahani, Mahathir Mohammad Bappy, Linkan Bian, Wenmeng Tian

2022Journal of Manufacturing Processes20 citationsDOI

Topics & Concepts

Materials scienceBenchmark (surveying)Layer (electronics)Process (computing)In situAnomaly detectionCertificationThermalComputer scienceArtificial intelligenceComposite materialGeodesyMeteorologyLawOperating systemPolitical sciencePhysicsGeographyAdditive Manufacturing Materials and ProcessesIndustrial Vision Systems and Defect DetectionAdvanced X-ray and CT Imaging
In-situ layer-wise certification for direct laser deposition processes based on thermal image series analysis | Litcius