Conduction mechanism effect on physical unclonable function using Al2O3/TiOX memristors
Jinwoo Park, Tae‐Hyeon Kim, Sungjoon Kim, Geun Ho Lee, Hussein Nili, Hyungjin Kim
Topics & Concepts
Reliability (semiconductor)MemristorRandomnessThermal conductionMaterials scienceConductanceNoise (video)Physical unclonable functionOptoelectronicsElectronic engineeringComputer scienceCondensed matter physicsPhysicsMathematicsEngineeringAlgorithmPower (physics)Artificial intelligenceStatisticsThermodynamicsCryptographyImage (mathematics)Composite materialAdvanced Memory and Neural ComputingPhysical Unclonable Functions (PUFs) and Hardware SecurityNeuroscience and Neural Engineering