A deep learning process anomaly detection approach with representative latent features for low discriminative and insufficient abnormal data
Yuan Gao, Xianhui Yin, Zhen He, Xueqing Wang
Topics & Concepts
Anomaly detectionAutoencoderDiscriminative modelArtificial intelligenceComputer sciencePattern recognition (psychology)Process (computing)Feature (linguistics)Feature selectionData miningAnomaly (physics)Machine learningDeep learningPhilosophyPhysicsOperating systemLinguisticsCondensed matter physicsAnomaly Detection Techniques and ApplicationsIndustrial Vision Systems and Defect DetectionAdvanced Statistical Process Monitoring