Atom column detection from simultaneously acquired ABF and ADF STEM images
Jarmo Fatermans, Arnold J. den Dekker, Knut Müller‐Caspary, Nicolas Gauquelin, Johan Verbeeck, Sandra Van Aert
Topics & Concepts
Scanning transmission electron microscopyDark field microscopyOpticsParametric statisticsPhysicsMaterials scienceScanning electron microscopeMicroscopyMathematicsStatisticsElectron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and ApplicationsX-ray Diffraction in Crystallography