Through-substrate terahertz time-domain reflection spectroscopy for environmental graphene conductivity mapping
Hungyen Lin, Oliver J. Burton, Sebastian Engelbrecht, Kai-Henning Tybussek, Bernd Fischer, Stephan Hofmann
Abstract
We demonstrate how terahertz time-domain spectroscopy (THz-TDS) operating in reflection geometry can be used for quantitative conductivity mapping of large area chemical vapor deposited graphene films through silicon support. We validate the technique against measurements performed using the established transmission based THz-TDS. Our through-substrate approach allows unhindered access to the graphene top surface and thus, as we discuss, opens up pathways to perform in situ and in-operando THz-TDS using environmental cells.
Topics & Concepts
GrapheneTerahertz radiationSubstrate (aquarium)Materials scienceReflection (computer programming)ConductivityOptoelectronicsSpectroscopySurface conductivitySiliconAttenuated total reflectionChemical vapor depositionTerahertz time-domain spectroscopyTerahertz spectroscopy and technologyTotal internal reflectionOpticsNanotechnologyChemistryPhysicsComputer sciencePhysical chemistryOceanographyQuantum mechanicsProgramming languageGeologyPhotonic Crystals and ApplicationsPhotonic and Optical DevicesTerahertz technology and applications