X-ray reflectivity and X-ray photoelectron spectroscopy studies on reactively sputtered $$\hbox {Nb}_{2}\hbox {O}_{5}$$-based thin-film devices
Karimul Islam, Rezwana Sultana, Abhishek Rakshit, U. K. Goutam, Supratic Chakraborty
Topics & Concepts
X-ray reflectivityX-ray photoelectron spectroscopyMaterials scienceThin filmAnalytical Chemistry (journal)SputteringSynchrotronX-rayX-ray spectroscopyCrystallographyOxideLattice constantSpectroscopyOpticsChemistryDiffractionPhysicsNanotechnologyNuclear magnetic resonanceMetallurgyChromatographyQuantum mechanicsAdvanced Memory and Neural ComputingSemiconductor materials and devicesTransition Metal Oxide Nanomaterials